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2000
Volume 21, Issue 6
  • ISSN: 1573-4137
  • E-ISSN: 1875-6786

Abstract

Introduction

With the advancement of technology, nanotechnology has emerged as a prominent research field. The Atomic Force Microscope (AFM) serves as a vital tool in nanoscience and technology, playing an indispensable role across various domains.

Methods

However, in the AFM photoelectric sensing system, the optical feedback noise from the beam deflection method can lead to inaccuracies in signal identification and analysis, impacting the accuracy and reliability of AFM measurements. To mitigate this interference, this study proposes a high-frequency current superposition system aimed at reducing optical feedback noise. By superimposing high-frequency currents, the semiconductor laser transitions from a single-mode to a multi-mode operational state, thereby altering its mode of operation and consequently reducing optical feedback noise during sensing. Initially, mathematical modeling and simulation analysis were conducted on the high-frequency current superposition noise reduction system to examine the impact of high-frequency current on the intensity noise of the semiconductor laser. Subsequently, the design of the high-frequency current superposition noise reduction system was outlined, encompassing the development of a constant current drive circuit, a voltage-controlled oscillator circuit, and a biasing circuit. Finally, the high-frequency current superposition noise reduction system underwent testing.

Results

During the high-frequency current superposition noise reduction test, the system's Signal-to-Noise Ratio (SNR) increased from 15.57 dB to 17.81 dB, and the system's noise peak-to-peak value decreased from 8 mV to 6 mV. Analysis of the superposition frequency and noise reduction effect determined the optimal superposition frequency of the AFM photoelectric sensor system to be 400 MHz. Characterization experiments of the high-frequency superposition noise reduction system compared the clarity of Escherichia coli images before and after noise reduction.

Conclusion

The aforementioned experimental results demonstrated that high-frequency current superposition is an effective noise reduction method capable of mitigating optical noise in the AFM photoelectric sensing system.

© 2025 Bentham Science Publishers
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2025-09-01

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Reduction in Optical Feedback Noise of Atomic Force Microscopy by High-Frequency Current Modulation
Curr. Nanosci. 21, 1028 (2025); https://doi.org/10.2174/0115734137319121241007055422
/content/journals/cnano/10.2174/0115734137319121241007055422
/content/journals/cnano/10.2174/0115734137319121241007055422
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  • Article Type:     Research Article
Keyword(s): AFM; high-frequency current modulation; optical feedback noise; semiconductor laser; voltage-controlled

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