Skip to content
2000
Volume 6, Issue 3
  • ISSN: 2211-3347
  • E-ISSN:

Abstract

Sapphire single-crystals are one of the industrial favorite substrates for GaN film deposition and LED application as well as a model system for oxides’ aqueous interfacial chemistry studies. Contamination control of sapphire substrates is critical to the device fabrication and experimental studies of interfacial properties. Here we reviewed various methods reported in the literature including conventional and new wet-chemical methods, and UV/plasma methods. Special attentions were paid to their cleaning performance in terms of reliably removing organic/particulate/heavy metallic contaminants.

Loading

Article metrics loading...

/content/journals/cheng/10.2174/2211334707999140331121752
2013-12-01
2024-10-09
Loading full text...

Full text loading...

/content/journals/cheng/10.2174/2211334707999140331121752
Loading
This is a required field
Please enter a valid email address
Approval was a Success
Invalid data
An Error Occurred
Approval was partially successful, following selected items could not be processed due to error
Please enter a valid_number test